BIBFRAME Work

Title

Ellipsometry of Functional Organic Surfaces and Films

Type

• Monograph
• Text

Contribution

• Hinrichs, Karsten (editor )
• Eichhorn, Klaus-Jochen (editor )

Subject

• Interfaces (Physical sciences) (LCSH)
• C21001
• Lasers (LCSH)
• Materials-Surfaces (LCSH)
• PHFC
• Z17000
• Z19000
• Materials science (LCSH)
• Photonics (LCSH)
• Chemistry, Physical and theoretical (LCSH)
• P31030
• Thin films (LCSH)
• P25160
• Surfaces (Physics) (LCSH)
• SCI077000 (BISACSH)

Language

• English

Classification

• DDC: 530.417
• LCC: QC176.8.S8 (Status: not used by assigner) (Status: upgraded prepub)
• LCC: QC611.6.S9 (Status: not used by assigner) (Status: upgraded prepub)

Content

• text

Summary

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.

Table of Contents

Indtroduction -- Ellipsometry: A survey of Concept -- Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared spectroscopic methods for characterization of thin organic films -- Brillant infrared light sources for micro-ellipsometric studies of organic films -- Optical constants.

Authorized Access Point

Ellipsometry of Functional Organic Surfaces and Films

Admin Metadata

• Date: 2026-09-11T20:13:07.182403+00:00
• Agent: cbc
• Status: c
• Derived from: 21816848

Admin Metadata

• Date: 2026-09-11
• Cataloger id: Unknown
• Description level: http://id.loc.gov/ontologies/bibframe-2-6-0/
• Description language: eng
• Description authentication: pcc