BIBFRAME Work

Title

EM Material Characterization Techniques for Metamaterials

Type

• Monograph
• Text

Contribution

• Venu, K. S. (author)
• P.S., Mohammed Yazeen (author)
• Nair, Raveendranath U. (author)
• Dutta, Maumita (author)

Subject

• TEC024000 (BISACSH)
• Optical engineering (LCSH)
• Optical materials (LCSH)
• Electronics--Materials (LCSH)
• TJFN
• T24019
• Microwaves (LCSH)
• Electrical engineering (LCSH)
• T24035
• Z12000

Language

• English

Classification

• LCC: TK7876-7876.42 (Status: not used by assigner) (Status: upgraded prepub)
• DDC: 621.3

Content

• text

Summary

This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials.

Authorized Access Point

Nair, Raveendranath U. EM Material Characterization Techniques for Metamaterials

Admin Metadata

• Date: 2026-09-11T20:18:03.443473+00:00
• Agent: cbc
• Status: c
• Derived from: 21680730

Admin Metadata

• Date: 2026-09-11
• Cataloger id: Unknown
• Description level: http://id.loc.gov/ontologies/bibframe-2-6-0/
• Description language: eng
• Description authentication: pcc